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PDL測(cè)試儀  OCA-1000

PDL測(cè)試儀 OCA-1000


  • 寬波長(zhǎng)范圍
  • 高 PDL 精度
  • 高通道間均勻性
  • 用戶友好的控制程序

產(chǎn)品簡(jiǎn)介

OCA-1000 是一款多通道光學(xué)元件分析儀,可同時(shí)測(cè)量多路光纖上的插入損耗 (IL)、偏振相關(guān)損耗 (PDL) 和光功率 (P)路徑。測(cè)量基于穆勒矩陣方法,可提供快速表征對(duì)當(dāng)今光通信至關(guān)重要的波長(zhǎng)相關(guān)光參數(shù)系統(tǒng)。基本型號(hào)最多可以有 8 個(gè)通道。自定義 8 或 16 通道擴(kuò)展單元可以
添加以將系統(tǒng)容量增加到多達(dá) 40 個(gè)通道。

該儀器帶有一個(gè)帶有內(nèi)置功能的控制程序,可顯示測(cè)量的功率、IL 和 PDL 與波長(zhǎng)的關(guān)系或監(jiān)控時(shí)間變化所有通道的功率/IL 同時(shí)確定它們的穩(wěn)定性。對(duì)于 AWG 表征,數(shù)據(jù)分析軟件還計(jì)算通帶中心波長(zhǎng)、帶寬和平坦度以及通道間串?dāng)_(來(lái)自相鄰和非相鄰?fù)ǖ溃?/p>

OCA-1000 是一種理想的解決方案,可輕松、準(zhǔn)確地表征具有多個(gè)輸出的組件和模塊,包括 DWDM、ROADM、AWG 和PLC。它可以與各種可調(diào)諧激光器一起使用,例如 Keysight 或 Santec 的激光器。這種靈活性充分利用了現(xiàn)有的激光資源,減少了進(jìn)行此類測(cè)量的成本。其快速測(cè)量減少了表征具有大量端口的設(shè)備所需的時(shí)間,從而實(shí)現(xiàn)更高生產(chǎn)吞吐量。

Features:

  • Wide wavelength range
  • High PDL accuracy
  • High channel-to-channel uniformity
  • User-friendly control program

Applications:

  • PDL vs. wavelength measurement
  • IL vs. wavelength measurement
  • IL/Power vs. Time
  • Pass band parameters: center frequency, BW, ripple, noise floor
  • Fiber optic component characterization
  • Network component characterization (e.g. DWDM, ROADM.)
  • Planar Lightwave Circuits (PLC)
  • Photonic Integrated Circuit (PIC)

典型性能數(shù)據(jù):

Figure 1

Figure 1. Transmission vs. wavelength for 8 channels of an arrayed waveguide grating (AWG). Pass bands for each channel are clearly visible.

Figure 2

Figure 2. IL and PDL vs. wavelength for one channel of the AWG. PDL is relatively flat over the passband of this channel.

Figure 3

Figure 3 Detailed transmission vs. wavelength data for one channel of the same AWG. The plot shows the maximum, minimum, and average transmission vs. wavelength. The difference between maximum and minimum is an indication of the polarization dependent behavior for this device. The table shows the passband, flatness, and crosstalk information for this channel.

Figure 4

Figure 4. PDL vs. wavelength for a 1.96dB PDL artifact. The data indicates that the PDL of this device is relatively flat over the tested wavelength range.


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